Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

Onderzoeksoutput: Bijdrage aan tijdschrift › Congresartikel › peer review

Originele taal-2	Engels
Pagina's (van-tot)	1850-1851
Aantal pagina's	2
Tijdschrift	Microscopy and Microanalysis
Volume	16
Nummer van het tijdschrift	S2
DOI's	https://doi.org/10.1017/S1431927610059428
Status	Gepubliceerd - 1 aug 2010

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@article{af93067feb9448d395767bbae4a3451e,

title = "Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations",

author = "Heiner Friedrich and C.J. Gommes and \{Jongh, de\}, P.E. and \{de Jong\}, K.P.",

year = "2010",

month = aug,

day = "1",

doi = "10.1017/S1431927610059428",

language = "English",

volume = "16",

pages = "1850--1851",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

AU - Friedrich, Heiner

AU - Gommes, C.J.

AU - Jongh, de, P.E.

AU - de Jong, K.P.

PY - 2010/8/1

Y1 - 2010/8/1

U2 - 10.1017/S1431927610059428

DO - 10.1017/S1431927610059428

M3 - Conference article

SN - 1431-9276

VL - 16

SP - 1850

EP - 1851

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -