Automated Testing of Arrayed Waveguide Gratings: From Optical Alignment to Data Analysis

Scriptie/Masterproef: Master


Die testing is an important part of the manufacturing
process of photonic integrated circuits. Often, it involves the
alignment of optical fibers to on-chip waveguides with sub-micron
precision. This paper shows the implementation of an improved
automatic alignment algorithm. Its performance has been validated
during automatic characterization of arrayed waveguide
gratings (AWGs), and a decrease in overall measurement time of
42% with an increase in coupling power of 0.4 dB was observed
in comparison to a conventional iterative hill-climbing algorithm.
Furthermore, this paper shows the development of an AWG
analysis module to further increase testing throughput. It outputs
a one-page analysis summary to enable quick and easy validation
of AWG designs.
Datum prijs27 nov 2020
Originele taalEngels
Prijsuitreikende instantie
  • Technische Universiteit Eindhoven
BegeleiderKevin A. Williams (Afstudeerdocent 1), Xaveer J.M. Leijtens (Afstudeerdocent 2), Dzmitry Pustakhod (Afstudeerdocent 2) & Jelmer Weda (Externe coach)

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