Andreev reflection in focused beam induced deposited materials

: a multichannel model

Samenvatting

In a junction between a superconductor and a ferromagnet a process called Andreev reflection occurs that influences the conductance across the interface. When studying Andreev reflection in junctions made by focussed beam induced deposition (FE/IBID), several anomalies were observed. Analysing these anomalies has allowed us to gain more insight into the characteristics of FIBID W as a superconductor. To explain shoulder shapes that were observed in our Andreev reflection spectra, we have introduced a multichannel model that describes how conductance over the point contact consists of multiple independent conductive channels, resulting in a superposition of multiple conductance curves with different parameters. Such a multichannel pointcontact can be formed because FIBID W consists of multiple superconducting phases as was confirmed in a characterisation study.

Datum prijs	31 mei 2014
Originele taal	Engels
Begeleider	N. Sharma (Afstudeerdocent 1), Jürgen T. Kohlhepp (Afstudeerdocent 2), O. Kurnosikov (Afstudeerdocent 2) & Bert Koopmans (Afstudeerdocent 2)