Word line pulsing technique for stability fault detection in SRAM cells

A. Pavlov; M. Azimane; J. Pineda de Gyvez; M. Sachdev

doi:10.1109/TEST.2005.1584045

Word line pulsing technique for stability fault detection in SRAM cells

A. Pavlov, M. Azimane, J. Pineda de Gyvez, M. Sachdev

Dynamics and Control

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

12 Citaten (Scopus)

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Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability

Originele taal-2	Engels
Titel	Test Conference, 2005. Proceedings. ITC 2005. IEEE International, Austin, TX, 8 November 2005
Plaats van productie	Piscataway
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	33.I-1/10
ISBN van geprinte versie	0-7803-9038-5
DOI's	https://doi.org/10.1109/TEST.2005.1584045
Status	Gepubliceerd - 2005

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10.1109/TEST.2005.1584045

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title = "Word line pulsing technique for stability fault detection in SRAM cells",

abstract = "Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability",

author = "A. Pavlov and M. Azimane and {Pineda de Gyvez}, J. and M. Sachdev",

year = "2005",

doi = "10.1109/TEST.2005.1584045",

language = "English",

isbn = "0-7803-9038-5",

pages = "33.I--1/10",

booktitle = "Test Conference, 2005. Proceedings. ITC 2005. IEEE International, Austin, TX, 8 November 2005",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

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Word line pulsing technique for stability fault detection in SRAM cells. / Pavlov, A.; Azimane, M.; Pineda de Gyvez, J. et al.

Test Conference, 2005. Proceedings. ITC 2005. IEEE International, Austin, TX, 8 November 2005. Piscataway : Institute of Electrical and Electronics Engineers, 2005. blz. 33.I-1/10.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Word line pulsing technique for stability fault detection in SRAM cells

AU - Pavlov, A.

AU - Azimane, M.

AU - Pineda de Gyvez, J.

AU - Sachdev, M.

PY - 2005

Y1 - 2005

N2 - Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability

AB - Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability

U2 - 10.1109/TEST.2005.1584045

DO - 10.1109/TEST.2005.1584045

M3 - Conference contribution

SN - 0-7803-9038-5

SP - 33.I-1/10

BT - Test Conference, 2005. Proceedings. ITC 2005. IEEE International, Austin, TX, 8 November 2005

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Word line pulsing technique for stability fault detection in SRAM cells

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