Word line pulsing technique for stability fault detection in SRAM cells

A. Pavlov, M. Azimane, J. Pineda de Gyvez, M. Sachdev

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

11 Citaten (Scopus)
112 Downloads (Pure)

Samenvatting

Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability
Originele taal-2Engels
TitelTest Conference, 2005. Proceedings. ITC 2005. IEEE International, Austin, TX, 8 November 2005
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's33.I-1/10
ISBN van geprinte versie0-7803-9038-5
DOI's
StatusGepubliceerd - 2005

Vingerafdruk

Duik in de onderzoeksthema's van 'Word line pulsing technique for stability fault detection in SRAM cells'. Samen vormen ze een unieke vingerafdruk.

Citeer dit