Samenvatting
Understanding the electron scattering mechanisms dominating transport in high and low mobility transparent conducting oxides can provide insight into improving the properties of this crucial photovoltaic device layer. Contributions from ionized impurity scattering, phonon scattering, and grain boundary scattering were measured and quantified in hydrogenated indium oxide thin films, which had varying composition and grain size, resulting in a wide range of carrier densities (∼ 101Scm-3-∼ 1020cm-3) and carrier mobilities (∼ 10 cm2/Vs - > 100 cm2Vs). We used temperature-dependent Hall measurements from 5-300 Kelvin to characterize electrical properties of the sputtered films. Grain boundary scattering dominated films with the lowest mobility, whereas films with > 100 cm2/Vs mobilities were dominated by contributions from ionized impurity scattering and polar optical phonon scattering.
| Originele taal-2 | Engels |
|---|---|
| Titel | 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC |
| Uitgeverij | Institute of Electrical and Electronics Engineers |
| Pagina's | 1810-1813 |
| Aantal pagina's | 4 |
| ISBN van elektronische versie | 9781538685297 |
| DOI's | |
| Status | Gepubliceerd - 29 nov 2018 |
| Extern gepubliceerd | Ja |
| Evenement | 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, Verenigde Staten van Amerika Duur: 10 jun 2018 → 15 jun 2018 |
Congres
| Congres | 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 |
|---|---|
| Land/Regio | Verenigde Staten van Amerika |
| Stad | Waikoloa Village |
| Periode | 10/06/18 → 15/06/18 |
Bibliografische nota
Publisher Copyright:© 2018 IEEE.
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