Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de; Y. Lu; G. Nagappan

doi:10.1109/ICMIT.2006.262283

Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de
, Y. Lu
, G. Nagappan

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proceedings of the IEEE International Conference on Management Innovation and Technology 2006
Plaats van productie	Piscataway
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	571-575
Volume	2
DOI's	https://doi.org/10.1109/ICMIT.2006.262283
Status	Gepubliceerd - 2006
Evenement	conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 - Duur: 21 jun 2006 → 23 jun 2006

Congres

Congres	conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23
Periode	21/06/06 → 23/06/06
Ander	IEEE International conference on Management of Innovation and Technology, Singapore

Toegang tot document

10.1109/ICMIT.2006.262283

Citeer dit

@inproceedings{07ca6453594e46b6b1c53b80e9cb3097,

title = "Understanding failure severity in new product development processes of consumer electronics products",

author = "\{Visser, de\}, I.M. and Y. Lu and G. Nagappan",

year = "2006",

doi = "10.1109/ICMIT.2006.262283",

language = "English",

volume = "2",

pages = "571--575",

booktitle = "Proceedings of the IEEE International Conference on Management Innovation and Technology 2006",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 ; Conference date: 21-06-2006 Through 23-06-2006",

}

Visser, de, IM, Lu, Y & Nagappan, G 2006, Understanding failure severity in new product development processes of consumer electronics products. in Proceedings of the IEEE International Conference on Management Innovation and Technology 2006. vol. 2, Institute of Electrical and Electronics Engineers, Piscataway, blz. 571-575, conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23, 21/06/06. https://doi.org/10.1109/ICMIT.2006.262283

Understanding failure severity in new product development processes of consumer electronics products. / Visser, de, I.M.; Lu, Y.; Nagappan, G.
Proceedings of the IEEE International Conference on Management Innovation and Technology 2006. Vol. 2 Piscataway: Institute of Electrical and Electronics Engineers, 2006. blz. 571-575.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Understanding failure severity in new product development processes of consumer electronics products

AU - Visser, de, I.M.

AU - Lu, Y.

AU - Nagappan, G.

PY - 2006

Y1 - 2006

U2 - 10.1109/ICMIT.2006.262283

DO - 10.1109/ICMIT.2006.262283

M3 - Conference contribution

VL - 2

SP - 571

EP - 575

BT - Proceedings of the IEEE International Conference on Management Innovation and Technology 2006

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - conference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23

Y2 - 21 June 2006 through 23 June 2006

ER -