Understanding failure severity in new product development processes of consumer electronics products

I.M. Visser, de, Y. Lu, G. Nagappan

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    3 Citaten (Scopus)
    Originele taal-2Engels
    TitelProceedings of the IEEE International Conference on Management Innovation and Technology 2006
    Plaats van productiePiscataway
    UitgeverijInstitute of Electrical and Electronics Engineers
    Pagina's571-575
    Volume2
    DOI's
    StatusGepubliceerd - 2006
    Evenementconference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23 -
    Duur: 21 jun 200623 jun 2006

    Congres

    Congresconference; IEEE International conference on Management of Innovation and Technology, Singapore; 2006-06-21; 2006-06-23
    Periode21/06/0623/06/06
    AnderIEEE International conference on Management of Innovation and Technology, Singapore

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