Uncertainty analysis of roughness standard calibration using stylus instruments

H. Haitjema

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademic

37 Citaten (Scopus)


A stylus instrument was characterized and calibrated, including a dynamic calibration of the probe. This stylus instrument was used to calibrate ten roughness standards for six surface roughness parameters. The sensitivity of each parameter of each standard to such measurement conditions as stylus geometry, measurement force, cut-off wavelength, and so forth was determined experimentally. These results were used for an uncertainty evaluation of each parameter for each roughness standard. It is shown that the manufacturers’ specification for the stylus instrument (2% uncertainty in roughness parameters) is approximately correct for the most commonly used samples and parameters, but the uncertainty may range from 0.03% (for sinusoidal profiles) to 100% (for very fine surfaces), depending upon the standard and parameter to be calibrated.
Originele taal-2Engels
Pagina's (van-tot)110-119
TijdschriftPrecision Engineering
Nummer van het tijdschrift2
StatusGepubliceerd - 1998


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