Samenvatting
Focused ion beam instruments a"re indispensable tools for the semiconductor
industry due to their ability to image and modify structures on the nanometer
length scale. For milling and deposition, the industry standard is the gallium
liquid-metal ion source which enables a resorution of 5-10 nm at a current
of a few pA. with the quest towards smaller features on integrated circuits,
there is a need for novel ion sources that allow for better resolution. Several
research groups are working towards applying laser-intensified alkali-metal ion
beams for this purpose [1].
s-uch ultra-low temperature (1 mK) ion beams can be created by lasercooling
and photo-ionization of a thermal atomic beam or vapor. The Rb ion
source under development in Eindhoven in collaboration with FEI c
Originele taal-2 | Engels |
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Titel | iCoRD Book of Abstracts |
Subtitel | International conference on Rydbergs at Durham |
Plaats van productie | Durham |
Uitgeverij | Durham University |
Pagina's | 61 |
Aantal pagina's | 1 |
Status | Gepubliceerd - 2015 |
Evenement | iCord_International Conference on Rydberg at Durham; 2015-07-03; 2015-07-03 - Durham, Verenigd Koninkrijk Duur: 3 jul. 2015 → 3 jul. 2015 |
Congres
Congres | iCord_International Conference on Rydberg at Durham; 2015-07-03; 2015-07-03 |
---|---|
Land/Regio | Verenigd Koninkrijk |
Stad | Durham |
Periode | 3/07/15 → 3/07/15 |
Ander | iCord_International Conference on Rydberg at Durham |