Two-dimensional inverse profiling: nonlinear optimization and embedding (invited)

A.G. Tijhuis, K. Belkebir, A.C.S. Litman, J.M. Geffrin, J.Ch. Bolomey

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

Originele taal-2	Engels
Titel	Advanced Pattern Recognition Techniques, RTO Lecture Series 214
Plaats van productie	Neuilly-sur-Seine, France
Uitgeverij	NATO
Pagina's	6.1-6.3
ISBN van geprinte versie	92-837-1001-0
Status	Gepubliceerd - 1998

Citeer dit

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title = "Two-dimensional inverse profiling: nonlinear optimization and embedding (invited)",

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year = "1998",

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T1 - Two-dimensional inverse profiling: nonlinear optimization and embedding (invited)

AU - Tijhuis, A.G.

AU - Belkebir, K.

AU - Litman, A.C.S.

AU - Geffrin, J.M.

AU - Bolomey, J.Ch.

PY - 1998

Y1 - 1998

M3 - Chapter

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BT - Advanced Pattern Recognition Techniques, RTO Lecture Series 214

PB - NATO

CY - Neuilly-sur-Seine, France

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