Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis, A.I.M. Franchois, W. Janssen, A.P.M. Zwamborn

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProc. of Workshop on Microwave Process Tomography
StatusGepubliceerd - 2000
Evenementconference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19 -
Duur: 18 dec 200019 dec 2000

Congres

Congresconference; Workshop on Microwave Process Tomography, Paris; 2000-12-18; 2000-12-19
Periode18/12/0019/12/00
AnderWorkshop on Microwave Process Tomography, Paris

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