Two-dimensional inverse profiling in a complex environment

A.G. Tijhuis, A.I.M. Franchois, W. Janssen, A.P.M. Zwamborn

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques
Status	Gepubliceerd - 2000
Evenement	European Microwave Week, 30th Workshop on Microwave Imaging Methods and Techniques - Paris, Frankrijk Duur: 2 okt. 2000 → 6 okt. 2000

Congres	European Microwave Week, 30th Workshop on Microwave Imaging Methods and Techniques
Land/Regio	Frankrijk
Stad	Paris
Periode	2/10/00 → 6/10/00
Ander	European Microwave Week, 30thWorkshop on Microwave Imaging Methods and Techniques, Paris

Citeer dit

@inproceedings{7bdc88bd68db43068abc9893972d3245,

title = "Two-dimensional inverse profiling in a complex environment",

author = "A.G. Tijhuis and A.I.M. Franchois and W. Janssen and A.P.M. Zwamborn",

year = "2000",

language = "English",

booktitle = "Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques",

note = "European Microwave Week, 30th Workshop on Microwave Imaging Methods and Techniques ; Conference date: 02-10-2000 Through 06-10-2000",

}

TY - GEN

T1 - Two-dimensional inverse profiling in a complex environment

AU - Tijhuis, A.G.

AU - Franchois, A.I.M.

AU - Janssen, W.

AU - Zwamborn, A.P.M.

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - Proc. of European Microwave Week, Workshop on Microwave Imaging Methods and Techniques

T2 - European Microwave Week, 30th Workshop on Microwave Imaging Methods and Techniques

Y2 - 2 October 2000 through 6 October 2000

ER -