Transition in layer structure of atomic/molecular layer deposited ZnO-zincone multilayers

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Uittreksel

In this work, atomic-resolution transmission electron microscopy studies show that in atomic/molecular layer deposited ZnO-zincone [(ZnO)a(Zn-O-C6H4-O)b] multilayer thin films, ZnO crystals grow vertically and continuously through lateral zincone monolayers. When the thickness of zincone is increased from one to few monolayers, the growth of the ZnO crystals becomes confined, leading to the formation of discrete ZnO/zincone interfaces accompanied by a decrease in roughness. Apart from providing understanding on the formation of interfaces and on the structure of hybrid multilayers, these findings are relevant, e.g., for understanding thermoelectric interface phenomena at inorganicorganic
interfaces and x-ray reflectometry of hybrid multilayer thin films.
TaalEngels
Artikelnummer040602
Aantal pagina's4
TijdschriftJournal of Vacuum Science and Technology. A: Vacuum, Surfaces, and Films
Volume37
Nummer van het tijdschrift4
Vroegere onlinedatum31 mei 2019
DOI's
StatusGepubliceerd - 1 jul 2019

Vingerafdruk

Multilayer films
Monolayers
Multilayers
Thin films
Crystals
Crystallization
Surface roughness
Transmission electron microscopy
X rays
thin films
crystals
roughness
transmission electron microscopy
x rays

Citeer dit

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abstract = "In this work, atomic-resolution transmission electron microscopy studies show that in atomic/molecular layer deposited ZnO-zincone [(ZnO)a(Zn-O-C6H4-O)b] multilayer thin films, ZnO crystals grow vertically and continuously through lateral zincone monolayers. When the thickness of zincone is increased from one to few monolayers, the growth of the ZnO crystals becomes confined, leading to the formation of discrete ZnO/zincone interfaces accompanied by a decrease in roughness. Apart from providing understanding on the formation of interfaces and on the structure of hybrid multilayers, these findings are relevant, e.g., for understanding thermoelectric interface phenomena at inorganicorganicinterfaces and x-ray reflectometry of hybrid multilayer thin films.",
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AU - Verheijen,Marcel

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AB - In this work, atomic-resolution transmission electron microscopy studies show that in atomic/molecular layer deposited ZnO-zincone [(ZnO)a(Zn-O-C6H4-O)b] multilayer thin films, ZnO crystals grow vertically and continuously through lateral zincone monolayers. When the thickness of zincone is increased from one to few monolayers, the growth of the ZnO crystals becomes confined, leading to the formation of discrete ZnO/zincone interfaces accompanied by a decrease in roughness. Apart from providing understanding on the formation of interfaces and on the structure of hybrid multilayers, these findings are relevant, e.g., for understanding thermoelectric interface phenomena at inorganicorganicinterfaces and x-ray reflectometry of hybrid multilayer thin films.

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