Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Kyle van Oosterhout; Martijn Timmermans; Marco Fattori; Eugenio Cantatore

doi:10.1109/IWASI58316.2023.10164482

Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Kyle van Oosterhout, Martijn Timmermans, Marco Fattori, Eugenio Cantatore

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Samenvatting

This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.

Originele taal-2	Engels
Titel	2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	160-165
Aantal pagina's	6
ISBN van elektronische versie	979-8-3503-3694-8
DOI's	https://doi.org/10.1109/IWASI58316.2023.10164482
Status	Gepubliceerd - 3 jul. 2023
Evenement	9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023 - Monopoli, Italië Duur: 8 jun. 2023 → 9 jun. 2023

Congres

Congres	9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023
Land/Regio	Italië
Stad	Monopoli
Periode	8/06/23 → 9/06/23

Financiering

This publication is a result of the project Smart-Sense (with project number 17608) which is (partly) financed by the Dutch Research Council (NWO).

Financiers	Financiernummer
Nederlandse Organisatie voor Wetenschappelijk Onderzoek

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van Oosterhout, K., Timmermans, M., Fattori, M., & Cantatore, E. (2023). Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. In 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI) (blz. 160-165). Artikel 10164482 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IWASI58316.2023.10164482

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title = "Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique",

abstract = "This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.",

keywords = "Analytical model, Linearization, Open-loop amplifier, Source degeneration, Transistor based source degeneration",

author = "{van Oosterhout}, Kyle and Martijn Timmermans and Marco Fattori and Eugenio Cantatore",

year = "2023",

month = jul,

day = "3",

doi = "10.1109/IWASI58316.2023.10164482",

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pages = "160--165",

booktitle = "2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023 ; Conference date: 08-06-2023 Through 09-06-2023",

}

van Oosterhout, K , Timmermans, M , Fattori, M & Cantatore, E 2023, Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. in 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)., 10164482, Institute of Electrical and Electronics Engineers, blz. 160-165, 9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023, Monopoli, Italië, 8/06/23. https://doi.org/10.1109/IWASI58316.2023.10164482

Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. / van Oosterhout, Kyle ; Timmermans, Martijn ; Fattori, Marco et al.
2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI). Institute of Electrical and Electronics Engineers, 2023. blz. 160-165 10164482.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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T2 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2023

AU - van Oosterhout, Kyle

AU - Timmermans, Martijn

AU - Fattori, Marco

AU - Cantatore, Eugenio

PY - 2023/7/3

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N2 - This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.

AB - This paper introduces a source degeneration technique using a diode-connected transistor as degeneration device rather than a conventional resistor improves the robustness against changes in biasing condition and temperature, and removes the need for calibration. The method is validated using an analytical model, as well as with simulations, both at very low bias currents (where the analytic exponential model matches the behaviour of the transistor very well) as well as closer to the threshold. The method shows an improvement of 6dB to 20dB in linearity when variation of bias current and temperature of 20% are considered. Using this technique would thus enable highly linear, power efficient, open-loop amplifiers without the need for calibration systems, which have an unavoidable power and area overhead.

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KW - Linearization

KW - Open-loop amplifier

KW - Source degeneration

KW - Transistor based source degeneration

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BT - 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)

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Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique

Samenvatting

Congres

Financiering

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