Transient absorption and linear dichroism in self-assembled InAs/GaAs quantum dots

E.W. Bogaart, J.E.M. Haverkort, T.J. Eijkemans, T. Mano, R. Nötzel, J.H. Wolter

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

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Samenvatting

Time-resolved and polarization-resolved measurements are preformed on InAs/GaAs quantum dots by means of time-resolved differential reflection spectroscopy. With this technique, the polarization anisotropy of the absorption bleaching in a quantum dot is measured. The excitation density dependent measurements of the bleaching magnitude, show a strong polarization dependence, which corresponds to linear dichroism. Dichroism with a magnitude of 1.3 is observed, governed by strain within the sample.
Originele taal-2Engels
TitelProceedings of the 9th annual symposium of the IEEE/LEOS Benelux Chapter 2-3 December 2004, Ghent, Belgium
Pagina's307-310
StatusGepubliceerd - 2004
Evenement9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium - Ghent, België
Duur: 2 dec 20043 dec 2004

Congres

Congres9th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 2-3, 2004, Ghent, Belgium
LandBelgië
StadGhent
Periode2/12/043/12/04
AnderAnn. Symp. IEEE/LEOS Benelux Chapter

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  • Citeer dit

    Bogaart, E. W., Haverkort, J. E. M., Eijkemans, T. J., Mano, T., Nötzel, R., & Wolter, J. H. (2004). Transient absorption and linear dichroism in self-assembled InAs/GaAs quantum dots. In Proceedings of the 9th annual symposium of the IEEE/LEOS Benelux Chapter 2-3 December 2004, Ghent, Belgium (blz. 307-310)