Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

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Samenvatting

Dynamic secondary ion mass spectrometry (SIMS) is usually applied to measure depth profiles in inorg. multi-layer systems. SIMS on org. multi-layer samples is highly complicated due to the complex fragmentation of the sample which results in fingerprint of masses representing the components in the sample. Using multivariate statistics, we succeeded to interpret the SIMS spectra and were able to identify layers with different compns. in artificially produced two-layer samples. The method is demonstrated for samples of a poly(isobornylmethacrylate) coating on a polymer dispersed liq. crystal consisting of the nematic liq. crystal (E7) and poly(isobornylmethacrylate). Quantification of the E7 concn. is complicated by evapn. in the vacuum system. IR spectroscopy proved that the loss of E7 from poly(isobornylmethacrylate) can be prevented by capping the sample with poly(vinyl alc.). Cooling to cryogenic temps. will be required to suppress further evapn. during SIMS anal. The SIMS depth resoln. of a two-layered sample was detd. by discriminant function anal. to be 130 nm at a depth of one micrometer, which allows the application of SIMS for a typical optical grating
Originele taal-2Engels
TitelLiquid Crystal Materials, Devices, and Applications X and Projection Displays X
RedacteurenL.-C. Chien, M.H. Wu
Plaats van productieBellingham, USA
UitgeverijSPIE
Pagina's94-101
ISBN van geprinte versie0-8194-5192-4
DOI's
StatusGepubliceerd - 2004
Evenementconference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21 -
Duur: 19 jan 200421 apr 2004

Publicatie series

NaamProceedings of SPIE
Volume5289
ISSN van geprinte versie0277-786X

Congres

Congresconference; Electronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21; 2004-01-19; 2004-04-21
Periode19/01/0421/04/04
AnderElectronic imaging, science and technology ; (San Jose, Calif.) : 2004.01.19-21

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  • Citeer dit

    Kjellander, B. K. C., IJzendoorn, van, L. J., Jong, de, A. M., Broer, D. J., Gennip, van, W. J. H., Voigt, de, M. J. A., & Niemantsverdriet, J. W. (2004). Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry. In L-C. Chien, & M. H. Wu (editors), Liquid Crystal Materials, Devices, and Applications X and Projection Displays X (blz. 94-101). (Proceedings of SPIE; Vol. 5289). SPIE. https://doi.org/10.1117/12.526549