TY - JOUR
T1 - Timing speculation with optimal in situ monitoring placement and within-cycle error prevention
AU - Ahmadi Balef, Hadi
AU - Fatemi, Hamed
AU - Goossens, Kees
AU - Pineda de Gyvez, Jose
PY - 2019/5/1
Y1 - 2019/5/1
N2 - In this paper, a timing speculation technique with low-overhead in situ delay monitors placed along critical paths is presented. The proposed insertion of monitors enables timing error prevention within the same clock cycle. Compared to other techniques, the design cost per monitor in our technique is low because no additional gates for the guard banding, inspection window generation, and short path extension are required. We benchmarked our approach on an ARM Cortex M0. The insertion strategy reduces the number of monitors by up to\sim 23\times , power by\sim 5.5\times , and area by\sim 2.8\times compared to the traditional in situ monitoring techniques that insert monitors at the flip-flops. The timing error correction uses a global clock stretching unit to prevent errors within one cycle. With the proposed error prevention technique, 22% more delay variation is tolerated with a negligible energy overhead of less than 1%.
AB - In this paper, a timing speculation technique with low-overhead in situ delay monitors placed along critical paths is presented. The proposed insertion of monitors enables timing error prevention within the same clock cycle. Compared to other techniques, the design cost per monitor in our technique is low because no additional gates for the guard banding, inspection window generation, and short path extension are required. We benchmarked our approach on an ARM Cortex M0. The insertion strategy reduces the number of monitors by up to\sim 23\times , power by\sim 5.5\times , and area by\sim 2.8\times compared to the traditional in situ monitoring techniques that insert monitors at the flip-flops. The timing error correction uses a global clock stretching unit to prevent errors within one cycle. With the proposed error prevention technique, 22% more delay variation is tolerated with a negligible energy overhead of less than 1%.
KW - In situ delay monitoring
KW - Timing error
KW - Timing speculation (ts)
KW - Variation resilience
UR - http://www.scopus.com/inward/record.url?scp=85065011344&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2019.2895972
DO - 10.1109/TVLSI.2019.2895972
M3 - Article
AN - SCOPUS:85065011344
SN - 1063-8210
VL - 27
SP - 1206
EP - 1217
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 5
M1 - 8642528
ER -