Thermalization of electrons in decaying extreme ultraviolet photons induced low pressure argon plasma

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We monitored—in the pressure range: 0.5–15 Pa—the electron temperature in decaying plasmas induced in argon gas by pulsed irradiation with extreme ultraviolet (EUV) photons with wavelengths closely around 13.5 nm. For this purpose, temporal measurements of the space-averaged and electric field weighted electron density after pulsed EUV irradiation are combined with an ambipolar diffusion model of the plasma. Results demonstrate that electrons are thermalized to room temperature before the plasma has fully expanded to the chamber walls for pressures of 3 Pa and higher. At pressures below 3 Pa, the electron temperature was found to be up to 0.1 eV above room temperature which is explained by the fact that plasma expansion is too quick for the electrons to fully thermalize. The comparison between plasma expansion duration towards a surface, plasma decay at a surface and time needed for thermalization and cooling of electrons is essential for designers of EUV lithography tools and EUV sources since the temperature of electrons dictates many fundamental physical processes.
TaalEngels
Artikelnummer035010
Pagina's1-8
TijdschriftPlasma Sources Science and Technology
Volume25
Nummer van het tijdschrift3
DOI's
StatusGepubliceerd - 6 apr 2016

Citeer dit

@article{3a292ec654aa4d45a3f03bcd25cfe485,
title = "Thermalization of electrons in decaying extreme ultraviolet photons induced low pressure argon plasma",
abstract = "We monitored—in the pressure range: 0.5–15 Pa—the electron temperature in decaying plasmas induced in argon gas by pulsed irradiation with extreme ultraviolet (EUV) photons with wavelengths closely around 13.5 nm. For this purpose, temporal measurements of the space-averaged and electric field weighted electron density after pulsed EUV irradiation are combined with an ambipolar diffusion model of the plasma. Results demonstrate that electrons are thermalized to room temperature before the plasma has fully expanded to the chamber walls for pressures of 3 Pa and higher. At pressures below 3 Pa, the electron temperature was found to be up to 0.1 eV above room temperature which is explained by the fact that plasma expansion is too quick for the electrons to fully thermalize. The comparison between plasma expansion duration towards a surface, plasma decay at a surface and time needed for thermalization and cooling of electrons is essential for designers of EUV lithography tools and EUV sources since the temperature of electrons dictates many fundamental physical processes.",
author = "J. Beckers and {van der Horst}, Ruud and E.A. Osorio and G.M.W. Kroesen and V.Y. Banine",
year = "2016",
month = "4",
day = "6",
doi = "10.1088/0963-0252/25/3/035010",
language = "English",
volume = "25",
pages = "1--8",
journal = "Plasma Sources Science and Technology",
issn = "0963-0252",
publisher = "Institute of Physics",
number = "3",

}

Thermalization of electrons in decaying extreme ultraviolet photons induced low pressure argon plasma. / Beckers, J.; van der Horst, Ruud; Osorio, E.A.; Kroesen, G.M.W.; Banine, V.Y.

In: Plasma Sources Science and Technology, Vol. 25, Nr. 3, 035010, 06.04.2016, blz. 1-8.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

TY - JOUR

T1 - Thermalization of electrons in decaying extreme ultraviolet photons induced low pressure argon plasma

AU - Beckers,J.

AU - van der Horst,Ruud

AU - Osorio,E.A.

AU - Kroesen,G.M.W.

AU - Banine,V.Y.

PY - 2016/4/6

Y1 - 2016/4/6

N2 - We monitored—in the pressure range: 0.5–15 Pa—the electron temperature in decaying plasmas induced in argon gas by pulsed irradiation with extreme ultraviolet (EUV) photons with wavelengths closely around 13.5 nm. For this purpose, temporal measurements of the space-averaged and electric field weighted electron density after pulsed EUV irradiation are combined with an ambipolar diffusion model of the plasma. Results demonstrate that electrons are thermalized to room temperature before the plasma has fully expanded to the chamber walls for pressures of 3 Pa and higher. At pressures below 3 Pa, the electron temperature was found to be up to 0.1 eV above room temperature which is explained by the fact that plasma expansion is too quick for the electrons to fully thermalize. The comparison between plasma expansion duration towards a surface, plasma decay at a surface and time needed for thermalization and cooling of electrons is essential for designers of EUV lithography tools and EUV sources since the temperature of electrons dictates many fundamental physical processes.

AB - We monitored—in the pressure range: 0.5–15 Pa—the electron temperature in decaying plasmas induced in argon gas by pulsed irradiation with extreme ultraviolet (EUV) photons with wavelengths closely around 13.5 nm. For this purpose, temporal measurements of the space-averaged and electric field weighted electron density after pulsed EUV irradiation are combined with an ambipolar diffusion model of the plasma. Results demonstrate that electrons are thermalized to room temperature before the plasma has fully expanded to the chamber walls for pressures of 3 Pa and higher. At pressures below 3 Pa, the electron temperature was found to be up to 0.1 eV above room temperature which is explained by the fact that plasma expansion is too quick for the electrons to fully thermalize. The comparison between plasma expansion duration towards a surface, plasma decay at a surface and time needed for thermalization and cooling of electrons is essential for designers of EUV lithography tools and EUV sources since the temperature of electrons dictates many fundamental physical processes.

U2 - 10.1088/0963-0252/25/3/035010

DO - 10.1088/0963-0252/25/3/035010

M3 - Article

VL - 25

SP - 1

EP - 8

JO - Plasma Sources Science and Technology

T2 - Plasma Sources Science and Technology

JF - Plasma Sources Science and Technology

SN - 0963-0252

IS - 3

M1 - 035010

ER -