Samenvatting
The thermal stress and lifetime of semiconductor power switches are largely influenced by its current flow profile. Considerable thermal stress and reduced lifetime problems occur especially at low
frequency operation. In this paper, a dynamic gate driver that supplies adjustable voltage is proposed to mitigate thermal stress for lifetime improvement.
frequency operation. In this paper, a dynamic gate driver that supplies adjustable voltage is proposed to mitigate thermal stress for lifetime improvement.
Originele taal-2 | Engels |
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Titel | IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2018) |
Plaats van productie | Brussels |
Status | Gepubliceerd - 24 mei 2018 |
Evenement | IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2018) - Bruxelles, België Duur: 24 mei 2018 → 25 mei 2018 http://yrs2018.ulb.be/ |
Congres
Congres | IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2018) |
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Verkorte titel | YRS2018 |
Land/Regio | België |
Stad | Bruxelles |
Periode | 24/05/18 → 25/05/18 |
Internet adres |