Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopy

J.F.M. van Rens, W. Verhoeven, J.G.H. Franssen, A. Lassise, X.F.D. Stragier, Erik R. Kieft, P.H.A. Mutsaers, O.J. Luiten

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12 Citaten (Scopus)
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We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM 110 mode as dynamic optical elements for ultrafast electron microscopy. We first derive the optical transfer matrix of an ideal pillbox cavity and use a Courant-Snyder formalism to calculate the 6D phase space propagation of a Gaussian electron distribution through the cavity. We derive closed, analytic expressions for the increase in transverse emittance and energy spread of the electron distribution. We demonstrate that for the special case of a beam focused in the center of the cavity, the low emittance and low energy spread of a high quality beam can be maintained, which allows high-repetition rate, ultrafast electron microscopy with 100 fs temporal resolution combined with the atomic resolution of a high-end TEM. This is confirmed by charged particle tracking simulations using a realistic cavity geometry, including fringe fields at the cavity entrance and exit apertures. ©
Originele taal-2Engels
Pagina's (van-tot)77-89
Aantal pagina's13
TijdschriftUltramicroscopy
Volume184B
DOI's
StatusGepubliceerd - 1 jan 2018

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