The study of s-d exchange interaction in zinc iron selenide semimagnetic semiconductor

A. Twardowski; P. Glod; W.J.M. Jonge, de; M. Demianiuk

doi:10.1016/0038-1098(87)90520-5

The study of s-d exchange interaction in zinc iron selenide semimagnetic semiconductor

A. Twardowski
, P. Glod
, W.J.M. Jonge, de
, M. Demianiuk

Physics of Nanostructures

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

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The magnetoreflectivity and magnetic susceptibility was measured in Zn1-xFexSe (x

Originele taal-2	Engels
Pagina's (van-tot)	63-67
Tijdschrift	Solid State Communications
Volume	64
Nummer van het tijdschrift	1
DOI's	https://doi.org/10.1016/0038-1098(87)90520-5
Status	Gepubliceerd - 1987

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10.1016/0038-1098(87)90520-5

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@article{1261a5db0f1e4005be5f2f94491a8772,

title = "The study of s-d exchange interaction in zinc iron selenide semimagnetic semiconductor",

abstract = "The magnetoreflectivity and magnetic susceptibility was measured in Zn1-xFexSe (x",

author = "A. Twardowski and P. Glod and \{Jonge, de\}, W.J.M. and M. Demianiuk",

year = "1987",

doi = "10.1016/0038-1098(87)90520-5",

language = "English",

volume = "64",

pages = "63--67",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - The study of s-d exchange interaction in zinc iron selenide semimagnetic semiconductor

AU - Twardowski, A.

AU - Glod, P.

AU - Jonge, de, W.J.M.

AU - Demianiuk, M.

PY - 1987

Y1 - 1987

N2 - The magnetoreflectivity and magnetic susceptibility was measured in Zn1-xFexSe (x

AB - The magnetoreflectivity and magnetic susceptibility was measured in Zn1-xFexSe (x

U2 - 10.1016/0038-1098(87)90520-5

DO - 10.1016/0038-1098(87)90520-5

M3 - Article

SN - 0038-1098

VL - 64

SP - 63

EP - 67

JO - Solid State Communications

JF - Solid State Communications

IS - 1

ER -

The study of s-d exchange interaction in zinc iron selenide semimagnetic semiconductor

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