The STM as a tool to measure the potential distribution inside soft organic semiconductors

M. Kemerink, P. Offermans, J.K.J. Duren, van, R.A.J. Janssen, P.M. Koenraad, H.W.M. Salemink, J.H. Wolter

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
Titel11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada
Pagina's106-
StatusGepubliceerd - 2001
Evenementconference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques -
Duur: 1 jan 2001 → …

Congres

Congresconference; 11th Int. Conf. on STM/Spectroscopy and Related Techniques
Periode1/01/01 → …
Ander11th Int. Conf. on STM/Spectroscopy and Related Techniques

Citeer dit

Kemerink, M., Offermans, P., Duren, van, J. K. J., Janssen, R. A. J., Koenraad, P. M., Salemink, H. W. M., & Wolter, J. H. (2001). The STM as a tool to measure the potential distribution inside soft organic semiconductors. In 11th Int. Conf. on STM/Spectroscopy and Related Techniques, 15-20 July 2001, Vancouver, Canada (blz. 106-)