Samenvatting
pn-Junctions in IC processes are investigated for the use as an inductive design component. Measurements of inductance, quality factor and noise under avalanche breakdown conditions are compared to device simulations and the theory for IMPATT diodes. Inhomogeneous breakdown is also investigated.
| Originele taal-2 | Engels |
|---|---|
| Titel | Proceedings of Bipolar/Bicmos Circuits and Technology Meeting |
| Uitgeverij | Institute of Electrical and Electronics Engineers |
| Pagina's | 125-128 |
| Aantal pagina's | 4 |
| ISBN van geprinte versie | 0-7803-2778-0 |
| DOI's | |
| Status | Gepubliceerd - 6 aug. 2020 |
| Extern gepubliceerd | Ja |
| Evenement | 1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, Verenigde Staten van Amerika Duur: 2 okt. 1995 → 3 okt. 1995 |
Congres
| Congres | 1995 IEEE Bipolar/BiCMOS Circuits and Technology Meeting |
|---|---|
| Land/Regio | Verenigde Staten van Amerika |
| Stad | Minneapolis |
| Periode | 2/10/95 → 3/10/95 |
Vingerafdruk
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