The influence of metal-support interactions on the whiteline intensity

M. Vaarkamp, J.T. Miller, F.S. Modica, D.C. Koningsberger

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

10 Citaten (Scopus)
56 Downloads (Pure)

Samenvatting

The whiteline intensity of Pt/K-LTL catalysts reduced at 300, 450, and 600 Deg decreases with increasing redn. temp. This change in whiteline intensity was ascribed to the removal of hydrogen from the metal-support interface by redn. at higher temp.
Originele taal-2Engels
TitelProceedings of the 7th International Conference on X-Ray Absorption Fine Structure, XAFS VII : Kobe, Japan, August 23 - 29, 1992
RedacteurenH. Kuroda, T. Ohta
Plaats van productieTokyo
UitgeverijPubl. Office, Japanese Journal of Applied Physics
Pagina's454-456
StatusGepubliceerd - 1993
Evenementconference; International Conference on X-Ray Absorption Fine Structure (XAFS) ; 7 (Kobe) : 1992.08.23-29 -
Duur: 1 jan 1993 → …

Publicatie series

NaamJapanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers
Nummersuppl. 2
Volume32
ISSN van geprinte versie0021-4922

Congres

Congresconference; International Conference on X-Ray Absorption Fine Structure (XAFS) ; 7 (Kobe) : 1992.08.23-29
Periode1/01/93 → …
AnderInternational Conference on X-Ray Absorption Fine Structure (XAFS) ; 7 (Kobe) : 1992.08.23-29

Vingerafdruk Duik in de onderzoeksthema's van 'The influence of metal-support interactions on the whiteline intensity'. Samen vormen ze een unieke vingerafdruk.

  • Citeer dit

    Vaarkamp, M., Miller, J. T., Modica, F. S., & Koningsberger, D. C. (1993). The influence of metal-support interactions on the whiteline intensity. In H. Kuroda, & T. Ohta (editors), Proceedings of the 7th International Conference on X-Ray Absorption Fine Structure, XAFS VII : Kobe, Japan, August 23 - 29, 1992 (blz. 454-456). (Japanese Journal of Applied Physics, Part 1 : Regular Papers and Short Notes & Review Papers; Vol. 32, Nr. suppl. 2). Publ. Office, Japanese Journal of Applied Physics.