When noise is used as a diagnostic tool to determine the reliability of a device, not only the noise parameters itself, but also the uncertainty in these noise parameters are important. For good devices, this uncertainty will be Gaussian. However, because of non-linear measurement errors caused by a digital spectrum analyzer, this uncertainty might deviate from Gaussianity. We have estimated this additional error through simulations. We conclude that this error can often be ignored.
|Tijdschrift||Microelectronics and Reliability : an International Journal and World Abstracting Service|
|Nummer van het tijdschrift||11|
|Status||Gepubliceerd - 2000|