The influence of a digital spectrum analyzer on the uncertainty in 1/f noise parameters

J. Briaire, L.K.J. Vandamme

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1 Citaat (Scopus)


When noise is used as a diagnostic tool to determine the reliability of a device, not only the noise parameters itself, but also the uncertainty in these noise parameters are important. For good devices, this uncertainty will be Gaussian. However, because of non-linear measurement errors caused by a digital spectrum analyzer, this uncertainty might deviate from Gaussianity. We have estimated this additional error through simulations. We conclude that this error can often be ignored.
Originele taal-2Engels
Pagina's (van-tot)1975-1980
Aantal pagina's6
TijdschriftMicroelectronics and Reliability : an International Journal and World Abstracting Service
Nummer van het tijdschrift11
StatusGepubliceerd - 2000


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