Test time reduction by optimal test sequencing

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

Originele taal-2	Engels
Titel	Tangram: Model-based integration and testing of complex high-tech systems
Redacteuren	J. Tretmans
Plaats van productie	Eindhoven
Uitgeverij	Embedded Systems Institute
Hoofdstuk	5
Pagina's	61-72
ISBN van geprinte versie	978-90-78679-02-8
Status	Gepubliceerd - 2007

Citeer dit

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title = "Test time reduction by optimal test sequencing",

author = "R. Boumen and \{Jong, de\}, I.S.M. and \{Mortel - Fronczak, van de\}, J.M. and J.E. Rooda",

year = "2007",

language = "English",

isbn = "978-90-78679-02-8",

pages = "61--72",

editor = "J. Tretmans",

booktitle = "Tangram: Model-based integration and testing of complex high-tech systems",

publisher = "Embedded Systems Institute",

}

TY - CHAP

T1 - Test time reduction by optimal test sequencing

AU - Boumen, R.

AU - Jong, de, I.S.M.

AU - Mortel - Fronczak, van de, J.M.

AU - Rooda, J.E.

PY - 2007

Y1 - 2007

M3 - Chapter

SN - 978-90-78679-02-8

SP - 61

EP - 72

BT - Tangram: Model-based integration and testing of complex high-tech systems

A2 - Tretmans, J.

PB - Embedded Systems Institute

CY - Eindhoven

ER -