Samenvatting
Applying tensile strain with silicon nitride is demonstrated to improve the responsivity of germanium-tin (Ge1-xSnx) PIN photodetectors at longer wavelengths. Such external stressor films show promise for extending the application of Ge1-xSnx optoelectronic devices into the mid-infrared range.
Originele taal-2 | Engels |
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Titel | 2016 IEEE Photonics Society Summer Topical Meeting Series (SUM), 1-13 July 2016, Newport Beach, California |
Plaats van productie | Piscataway |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 21-22 |
Aantal pagina's | 2 |
ISBN van elektronische versie | 978-1-5090-1900-7 |
ISBN van geprinte versie | 978-1-5090-1901-4 |
DOI's | |
Status | Gepubliceerd - 2016 |
Evenement | 2016 IEEE Photonics Society Summer Topical Meeting Series (SUM 2016) - Newport Beach Marriott Hotel, Newport Beach, Verenigde Staten van Amerika Duur: 11 jul. 2016 → 13 jul. 2016 http://www.photonicsconferences.org/conferences/welcome?id=357845c5e1df934a7bb02ae890b5c481 |
Congres
Congres | 2016 IEEE Photonics Society Summer Topical Meeting Series (SUM 2016) |
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Verkorte titel | SUM 2016 |
Land/Regio | Verenigde Staten van Amerika |
Stad | Newport Beach |
Periode | 11/07/16 → 13/07/16 |
Internet adres |