Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

P.L.J. Gunter, H.J. Borg, J.W. Niemantsverdriet, H.J.H. Rheiter

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Samenvatting

Angle-dependent XPS, static SIMS, and SEM were used to investigate the effect of a cleaning procedure on the compn., morphol., and thickness of passivation layers on tech. Al-4.5% Mg alloy foils. A com. cleaning soln. contg. Na2CO3, Na3PO4, and surfactants not only removed undesirable oil contamination efficiently, but also etched the surface. Because Mg-rich inclusions were etched at a rate higher than that of the surrounding Al, the foil acquired roughness on the scale of .apprx.100 nm, whereas at the same time the surface compn. changed. In particular, small amts. of phosphate were deposited on the surface. All these factors are considered favorable for increased adhesion of org. layers. [on SciFinder (R)]
Originele taal-2Engels
Pagina's (van-tot)2846-2851
TijdschriftJournal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
Volume10
Nummer van het tijdschrift4, Pt. 3
DOI's
StatusGepubliceerd - 1992

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