Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic

D. Petit, R. Lavrijsen, J. Lee, R. Mansell, A. Fernández-Pacheco, R.P. Cowburn

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Uittreksel

Magnetic kink solitons are used as a probe to experimentally measure the layer-by-layer coercivity and interlayer coupling strength of an antiferromagnetically coupled perpendicularly magnetized Co multilayer. The magnetic response is well described by a nearest neighbor Ising macrospin model. By controlling the position of one, two or three solitons in the stack using globally applied magnetic fields, we successfully probe the switching of individual buried layers under different neighboring configurations, allowing us to access individual layer's characteristic parameters. We found the coercivity to increase dramatically up the multilayer, while the interlayer coupling strength decreased slightly. We corroborate these findings with scanning transmission electron microscopy images where a degrading quality of the multilayer is observed. This method provides a very powerful tool to characterize the quality of individual layers in complex multilayers, without the need for depth-sensitive magnetic characterization equipment.

Originele taal-2Engels
Artikelnummer155203
TijdschriftNanotechnology
Volume27
Nummer van het tijdschrift15
DOI's
StatusGepubliceerd - 3 mrt 2016

Vingerafdruk

Multilayers
Data storage equipment
Coercive force
Solitons
Ising model
Magnetic fields
Transmission electron microscopy
Scanning electron microscopy

Citeer dit

Petit, D. ; Lavrijsen, R. ; Lee, J. ; Mansell, R. ; Fernández-Pacheco, A. ; Cowburn, R.P. / Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic. In: Nanotechnology. 2016 ; Vol. 27, Nr. 15.
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Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic. / Petit, D.; Lavrijsen, R.; Lee, J.; Mansell, R.; Fernández-Pacheco, A.; Cowburn, R.P.

In: Nanotechnology, Vol. 27, Nr. 15, 155203, 03.03.2016.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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