| Taal | Engels |
|---|---|
| Kwalificatie | Doctor in de Filosofie |
| Toekennende instantie |
|
| Begeleider(s)/adviseur |
|
| Datum van toekenning | 19 nov 2008 |
| Plaats van publicatie | Eindhoven |
| Uitgever | |
| Gedrukte ISBN's | 978-90-386-1437-3 |
| DOI's | |
| Status | Gepubliceerd - 2008 |
Bibliografische nota
Proefschrift.Citeer dit
Van Beneden, S. J. L. (2008). System characterization and reception techniques for two-dimensional optical storage Eindhoven: Technische Universiteit Eindhoven DOI: 10.6100/IR638352
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title = "System characterization and reception techniques for two-dimensional optical storage",
author = "{Van Beneden}, S.J.L.",
note = "Proefschrift.",
year = "2008",
doi = "10.6100/IR638352",
language = "English",
isbn = "978-90-386-1437-3",
publisher = "Technische Universiteit Eindhoven",
school = "Department of Electrical Engineering",
}
Van Beneden, SJL 2008, 'System characterization and reception techniques for two-dimensional optical storage', Doctor in de Filosofie, Faculteit Electrical Engineering, Eindhoven. DOI: 10.6100/IR638352
System characterization and reception techniques for two-dimensional optical storage. / Van Beneden, S.J.L.
Eindhoven : Technische Universiteit Eindhoven, 2008. 205 blz.Onderzoeksoutput: Scriptie › Dissertatie 1 (Onderzoek TU/e / Promotie TU/e) › Academic
TY - THES
T1 - System characterization and reception techniques for two-dimensional optical storage
AU - Van Beneden,S.J.L.
N1 - Proefschrift.
PY - 2008
Y1 - 2008
U2 - 10.6100/IR638352
DO - 10.6100/IR638352
M3 - Phd Thesis 1 (Research TU/e / Graduation TU/e)
SN - 978-90-386-1437-3
PB - Technische Universiteit Eindhoven
CY - Eindhoven
ER -
Van Beneden SJL. System characterization and reception techniques for two-dimensional optical storage. Eindhoven: Technische Universiteit Eindhoven, 2008. 205 blz. Beschikbaar vanaf, DOI: 10.6100/IR638352