Study of breakdown inside a supercritical plasma switch

J. Zhang, E.J.M. Heesch, van, F.J.C.M. Beckers, T. Huiskamp, A.J.M. Pemen

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

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Originele taal-2Engels
TitelProceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
DOI's
StatusGepubliceerd - 2013

Citeer dit

Zhang, J., Heesch, van, E. J. M., Beckers, F. J. C. M., Huiskamp, T., & Pemen, A. J. M. (2013). Study of breakdown inside a supercritical plasma switch. In Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/PLASMA.2013.6633336
Zhang, J. ; Heesch, van, E.J.M. ; Beckers, F.J.C.M. ; Huiskamp, T. ; Pemen, A.J.M. / Study of breakdown inside a supercritical plasma switch. Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California. Piscataway : Institute of Electrical and Electronics Engineers, 2013.
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Zhang, J, Heesch, van, EJM, Beckers, FJCM, Huiskamp, T & Pemen, AJM 2013, Study of breakdown inside a supercritical plasma switch. in Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California. Institute of Electrical and Electronics Engineers, Piscataway. https://doi.org/10.1109/PLASMA.2013.6633336

Study of breakdown inside a supercritical plasma switch. / Zhang, J.; Heesch, van, E.J.M.; Beckers, F.J.C.M.; Huiskamp, T.; Pemen, A.J.M.

Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California. Piscataway : Institute of Electrical and Electronics Engineers, 2013.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

TY - GEN

T1 - Study of breakdown inside a supercritical plasma switch

AU - Zhang, J.

AU - Heesch, van, E.J.M.

AU - Beckers, F.J.C.M.

AU - Huiskamp, T.

AU - Pemen, A.J.M.

PY - 2013

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U2 - 10.1109/PLASMA.2013.6633336

DO - 10.1109/PLASMA.2013.6633336

M3 - Conference contribution

BT - Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

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Zhang J, Heesch, van EJM, Beckers FJCM, Huiskamp T, Pemen AJM. Study of breakdown inside a supercritical plasma switch. In Proceedings of the IEEE Pulsed Power & Plasma Science Conference ( PPPS 2013), 16-21 June 2013, San Francisco, California. Piscataway: Institute of Electrical and Electronics Engineers. 2013 https://doi.org/10.1109/PLASMA.2013.6633336