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Structural Study of CoSi2/Si (001) and (111)

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    Samenvatting

    Nucleation and growth of CoSi2 films by thermal reaction of vapour deposited Co on (001) and (111) Si have been studied by transmission electron microscopy (TEM). On (001) Si, CoSi2 occurs in a number of orientations including the aligned (001) orientation. On (111) Si single crystalline layers are obtained, which are twin-oriented. In addition Si/CoSi2/Si structures have been formed by high-dose implantation of Co into (001) and (111) Si and subsequent annealing. In this way single crystalline ‘mesotaxial’ CoSi2 layers are obtained which are fully aligned with the Si-matrix. Epitaxial growth of CoSi2 on Si by conventional techniques (evaporation) and by high energy Co implantation is discussed.
    Originele taal-2Engels
    TitelHeterostructures on Silicon: One Step Further with Silicon
    RedacteurenY.I. Nissim, E. Rosencher
    UitgeverijSpringer
    Pagina's247-252
    Aantal pagina's6
    ISBN van elektronische versie978-94-009-0913-7
    ISBN van geprinte versie978-94-010-6900-7
    DOI's
    StatusGepubliceerd - 1989

    Publicatie series

    NaamNATO ASI Series, Series E: Applied Sciences
    Volume160
    ISSN van geprinte versie0168-132X

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