STM Imaging of ordered dopant incorporation in GaAs

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proc. of the 25th intern. symposium on compound semiconductors
Plaats van productie	San Diego, USA
Status	Gepubliceerd - 1997
Evenement	25th International Symposium on Compound Semiconductors - Duur: 8 sep. 1997 → 11 sep. 1997

Congres	25th International Symposium on Compound Semiconductors
Periode	8/09/97 → 11/09/97
Ander	25th Int. Symposium on Compound Semiconductors

Citeer dit

@inproceedings{ab50b5338a1d4f9eb6f2f6b1b75a9db1,

title = "STM Imaging of ordered dopant incorporation in GaAs",

author = "P.M. Koenraad and M.B. Johnson and H.W.M. Salemink and J.H. Wolter",

year = "1997",

language = "English",

booktitle = "Proc. of the 25th intern. symposium on compound semiconductors",

note = "25th International Symposium on Compound Semiconductors ; Conference date: 08-09-1997 Through 11-09-1997",

}

TY - GEN

T1 - STM Imaging of ordered dopant incorporation in GaAs

AU - Koenraad, P.M.

AU - Johnson, M.B.

AU - Salemink, H.W.M.

AU - Wolter, J.H.

PY - 1997

Y1 - 1997

M3 - Conference contribution

BT - Proc. of the 25th intern. symposium on compound semiconductors

CY - San Diego, USA

T2 - 25th International Symposium on Compound Semiconductors

Y2 - 8 September 1997 through 11 September 1997

ER -