Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses

Hajime Takayama; Chengmin Li; Jennifer Abou-Najm; Takashi Hikihara; Dražen Dujić

doi:10.1109/APEC43580.2023.10131236

Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses

Hajime Takayama
, Chengmin Li
, Jennifer Abou-Najm
, Takashi Hikihara
, Dražen Dujić

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

2 Citaten (Scopus)

Samenvatting

This paper presents an insulation test setup that emulates the mixed-frequency stresses experienced by magnetic devices in solid-state transformers (SSTs). Medium-frequency transformers (MFTs) utilized in SSTs typically face a superim-posed electric stress of two different frequencies, namely the grid frequency and the switching frequency of converter operation. Such mixed-frequency stress is regarded as a new concern for MFTs' insulation design. However, the test environment for such stress has been limited compared to those for traditional transformers. The aim of this paper is to fill this gap by proposing a test setup dedicated to mixed-frequency stresses. A battery-powered square-wave source is developed to be connected in series with an existing insulation test setup to emulate the stress, achieving a wide operating condition including the dv/dt and switching frequency. The details of the design are given, and the key operation is verified in the experiment.

Originele taal-2	Engels
Titel	2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	1510-1515
Aantal pagina's	6
ISBN van elektronische versie	978-1-6654-7539-6
DOI's	https://doi.org/10.1109/APEC43580.2023.10131236
Status	Gepubliceerd - 31 mei 2023
Extern gepubliceerd	Ja
Evenement	38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, Verenigde Staten van Amerika Duur: 19 mrt. 2023 → 23 mrt. 2023

Congres

Congres	38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Land/Regio	Verenigde Staten van Amerika
Stad	Orlando
Periode	19/03/23 → 23/03/23

Financiering

The main author (Hajime Takayama) was supported by JSPS Overseas Challenge Program for Young Researchers for his research stay at Power Electronics Laboratory at EPFL, Switzerland, when the work presented in the paper is conducted.

Financiers
Japan Society for the Promotion of Science

Toegang tot document

10.1109/APEC43580.2023.10131236

Andere bestanden en links

Link naar publicatie in Scopus

Citeer dit

Takayama, H., Li, C., Abou-Najm, J., Hikihara, T., & Dujić, D. (2023). Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses. In 2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023 (blz. 1510-1515). Artikel 10131236 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/APEC43580.2023.10131236

@inproceedings{e37b6568b630471991d6f22586ae792e,

title = "Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses",

abstract = "This paper presents an insulation test setup that emulates the mixed-frequency stresses experienced by magnetic devices in solid-state transformers (SSTs). Medium-frequency transformers (MFTs) utilized in SSTs typically face a superim-posed electric stress of two different frequencies, namely the grid frequency and the switching frequency of converter operation. Such mixed-frequency stress is regarded as a new concern for MFTs' insulation design. However, the test environment for such stress has been limited compared to those for traditional transformers. The aim of this paper is to fill this gap by proposing a test setup dedicated to mixed-frequency stresses. A battery-powered square-wave source is developed to be connected in series with an existing insulation test setup to emulate the stress, achieving a wide operating condition including the dv/dt and switching frequency. The details of the design are given, and the key operation is verified in the experiment.",

keywords = "insulation test, medium-frequency transformer, mixed-frequency stress, SiC MOSFET, solid-state transformer",

author = "Hajime Takayama and Chengmin Li and Jennifer Abou-Najm and Takashi Hikihara and Dra{\v z}en Duji{\'c}",

year = "2023",

month = may,

day = "31",

doi = "10.1109/APEC43580.2023.10131236",

language = "English",

pages = "1510--1515",

booktitle = "2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 ; Conference date: 19-03-2023 Through 23-03-2023",

}

Takayama, H, Li, C, Abou-Najm, J, Hikihara, T & Dujić, D 2023, Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses. in 2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023., 10131236, Institute of Electrical and Electronics Engineers, blz. 1510-1515, 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023, Orlando, Verenigde Staten van Amerika, 19/03/23. https://doi.org/10.1109/APEC43580.2023.10131236

Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses. / Takayama, Hajime; Li, Chengmin; Abou-Najm, Jennifer et al.
2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023. Institute of Electrical and Electronics Engineers, 2023. blz. 1510-1515 10131236.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses

AU - Takayama, Hajime

AU - Li, Chengmin

AU - Abou-Najm, Jennifer

AU - Hikihara, Takashi

AU - Dujić, Dražen

PY - 2023/5/31

Y1 - 2023/5/31

N2 - This paper presents an insulation test setup that emulates the mixed-frequency stresses experienced by magnetic devices in solid-state transformers (SSTs). Medium-frequency transformers (MFTs) utilized in SSTs typically face a superim-posed electric stress of two different frequencies, namely the grid frequency and the switching frequency of converter operation. Such mixed-frequency stress is regarded as a new concern for MFTs' insulation design. However, the test environment for such stress has been limited compared to those for traditional transformers. The aim of this paper is to fill this gap by proposing a test setup dedicated to mixed-frequency stresses. A battery-powered square-wave source is developed to be connected in series with an existing insulation test setup to emulate the stress, achieving a wide operating condition including the dv/dt and switching frequency. The details of the design are given, and the key operation is verified in the experiment.

AB - This paper presents an insulation test setup that emulates the mixed-frequency stresses experienced by magnetic devices in solid-state transformers (SSTs). Medium-frequency transformers (MFTs) utilized in SSTs typically face a superim-posed electric stress of two different frequencies, namely the grid frequency and the switching frequency of converter operation. Such mixed-frequency stress is regarded as a new concern for MFTs' insulation design. However, the test environment for such stress has been limited compared to those for traditional transformers. The aim of this paper is to fill this gap by proposing a test setup dedicated to mixed-frequency stresses. A battery-powered square-wave source is developed to be connected in series with an existing insulation test setup to emulate the stress, achieving a wide operating condition including the dv/dt and switching frequency. The details of the design are given, and the key operation is verified in the experiment.

KW - insulation test

KW - medium-frequency transformer

KW - mixed-frequency stress

KW - SiC MOSFET

KW - solid-state transformer

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DO - 10.1109/APEC43580.2023.10131236

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BT - 2023 IEEE Applied Power Electronics Conference and Exposition, APEC 2023

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T2 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023

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ER -

Square-Wave Source with Adjustable dv/dt for Insulation Testing under Mixed-Frequency Stresses

Samenvatting

Congres

Financiering

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