Spectroscopy in catalysis : an introduction

Onderzoeksoutput: Boek/rapportBoekAcademic

Samenvatting

Spectroscopy in Catalysis describes the most important modern analytical techniques used to investigate catalytic surfaces. These include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations. This second edition includes significant new developments, for example scanning probe microscopies, the imaging and vibrational techniques have been revised, the case studies expanded with an example on polymerization catalysts, and all the other chapters updated with recent examples and relevant new literature.
Originele taal-2Engels
Plaats van productieChichester
UitgeverijWiley-VCH Verlag
Aantal pagina's312
Uitgave2nd, compl. rev. ed.
ISBN van geprinte versie3-527-30200-X
StatusGepubliceerd - 2000

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  • Citeer dit

    Niemantsverdriet, J. W. (2000). Spectroscopy in catalysis : an introduction. (2nd, compl. rev. ed. redactie) Wiley-VCH Verlag.