Size, strain and band offset engineering in GaAs(Sb)(N)-capped InAs quantum dots for 1.3 – 1.55 μm emitters

J.M. Ulloa, M. Moral, del, M. Montes, M. Bozkurt, P.M. Koenraad, A. Guzman, A. Hierro

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademic

1 Citaat (Scopus)


The optical and structural properties of InAs/GaAs quantum dots (QD) are strongly modified through the use of a thin (~ 5 nm) GaAsSb(N) capping layer. In the case of GaAsSb-capped QDs, cross-sectional scanning tunnelling microscopy measurements show that the QD height can be controllably tuned through the Sb content up to ~ 14 % Sb. The increased QD height (together with the reduced strain) gives rise to a strong red shift and a large enhancement of the photoluminescence (PL) characteristics. This is due to improved carrier confinement and reduced sensitivity of the excitonic bandgap to QD size fluctuations within the ensemble. Moreover, the PL degradation with temperature is strongly reduced in the presence of Sb. Despite this, emission in the 1.5 µm region with these structures is only achieved for high Sb contents and a type-II band alignment that degrades the PL. Adding small amounts of N to the GaAsSb capping layer allows to progressively reduce the QD-barrier conduction band offset. This different strategy to red shift the PL allows reaching 1.5 µm with moderate Sb contents, keeping therefore a type-I alignment. Nevertheless, the PL emission is progressively degraded when the N content in the capping layer is increased.
Originele taal-2Engels
TitelQuantum Dots and Nanostructures: Synthesis, Characterization, and Modeling VIII, San Francisco, 2011
RedacteurenK.G. Eyink, F. Szmulowicz, D.L. Huffaker
Plaats van productieBellingham
StatusGepubliceerd - 2011

Publicatie series

NaamProceedings of SPIE
ISSN van geprinte versie0277-786X


Duik in de onderzoeksthema's van 'Size, strain and band offset engineering in GaAs(Sb)(N)-capped InAs quantum dots for 1.3 – 1.55 μm emitters'. Samen vormen ze een unieke vingerafdruk.

Citeer dit