Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

R.V. Mom, W.G. Onderwaater, M.J. Rost, M. Jankowski, S. Wenzel, L. Jacobse, P.F.A. Alkemade, V. Vandalon, M.A. van Spronsen, M. van Weeren, B. Crama, P. van der Tuijn, R. Felici, W.M.M. Kessels, F. Carlà, J.W.M. Frenken, I.M.N. Groot

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

4 Citaten (Scopus)

Samenvatting

A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.

Originele taal-2Engels
Pagina's (van-tot)233-242
Aantal pagina's10
TijdschriftUltramicroscopy
Volume182
DOI's
StatusGepubliceerd - 1 nov 2017

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  • Citeer dit

    Mom, R. V., Onderwaater, W. G., Rost, M. J., Jankowski, M., Wenzel, S., Jacobse, L., Alkemade, P. F. A., Vandalon, V., van Spronsen, M. A., van Weeren, M., Crama, B., van der Tuijn, P., Felici, R., Kessels, W. M. M., Carlà, F., Frenken, J. W. M., & Groot, I. M. N. (2017). Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment. Ultramicroscopy, 182, 233-242. https://doi.org/10.1016/j.ultramic.2017.07.011