Semiconductors studied by cross-sectional scanning tunneling microscopy

J.K. Garleff; J.M. Ulloa; P.M. Koenraad

doi:10.1007/978-3-642-10497-8

Semiconductors studied by cross-sectional scanning tunneling microscopy

J.K. Garleff, J.M. Ulloa, P.M. Koenraad

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

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Originele taal-2	Engels
Titel	Scanning probe microscopy in nanoscience and nanotechnology 2
Redacteuren	B. Bhushan
Plaats van productie	Heidelberg
Uitgeverij	Springer
Pagina's	321-353
ISBN van geprinte versie	978-3-642-10946-1
DOI's	https://doi.org/10.1007/978-3-642-10497-8
Status	Gepubliceerd - 2011

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10.1007/978-3-642-10497-8

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title = "Semiconductors studied by cross-sectional scanning tunneling microscopy",

abstract = "No abstract.",

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doi = "10.1007/978-3-642-10497-8",

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T1 - Semiconductors studied by cross-sectional scanning tunneling microscopy

AU - Garleff, J.K.

AU - Ulloa, J.M.

AU - Koenraad, P.M.

PY - 2011

Y1 - 2011

N2 - No abstract.

AB - No abstract.

U2 - 10.1007/978-3-642-10497-8

DO - 10.1007/978-3-642-10497-8

M3 - Chapter

SN - 978-3-642-10946-1

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BT - Scanning probe microscopy in nanoscience and nanotechnology 2

A2 - Bhushan, B.

PB - Springer

CY - Heidelberg

ER -

Semiconductors studied by cross-sectional scanning tunneling microscopy

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