Second-harmonic generation spectroscopy for interface studies of dielectric thin films on silicon

Engineering

• Dielectrics 100%
• Thin Films 100%
• Harmonic Generation 100%
• Passivation 80%
• Semiconductor Device 80%
• Electric Field 40%
• Device Performance 40%
• Space Charge Region 40%
• Nanometre 20%
• Defects 20%
• Semiconductor Material 20%
• State Condition 20%
• Induced Electric Field 20%
• Material System 20%
• Number Density 20%
• Processing Condition 20%
• Crystalline Silicon 20%
• Negative Charge 20%
• Field-Effect Transistor 20%
• Film Silicon 20%
• Internal Electric Field 20%
• Dielectric Film 20%
• Bulk Silicon 20%
• Wafer-Based Solar Cell 20%
• Solar Cell 20%
• Critical Point 20%
• Interlayer 20%
• Space Charge 20%

Material Science

• Dielectric Material 100%
• Silicon 100%
• Thin Films 100%
• Semiconductor Device 36%
• Materials Property 36%
• Film 27%
• Al2O3 27%
• Interface Property 27%
• Semiconductor Material 9%
• Crystalline Material 9%
• Mechanical Strength 9%
• Density 9%
• Solar Cell 9%
• Field Effect Transistors 9%
• Bulk Silicon 9%
• Dielectric Films 9%
• Functional Materials 9%
• Wafer-Based Solar Cell 9%