Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

J. Lucassen, F. Kloodt-Twesten, R. Frömter, H.P. Oepen, R.A. Duine, H.J.M. Swagten, B. Koopmans, R. Lavrijsen

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Uittreksel

We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing a thin layer of Fe on top of the multilayer, we image the underlying out-of-plane domain state through the mapping of its stray fields in the Fe. We also demonstrate that SEMPA can be used to image the domain wall chirality in these systems after milling away the capping layer and imaging the topmost magnetic layer directly.

Originele taal-2Engels
Artikelnummer132403
Aantal pagina's5
TijdschriftApplied Physics Letters
Volume111
Nummer van het tijdschrift13
DOI's
StatusGepubliceerd - 25 sep 2017

Vingerafdruk

textures
scanning electron microscopy
polarization
chirality
domain wall
magnetization

Citeer dit

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abstract = "We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing a thin layer of Fe on top of the multilayer, we image the underlying out-of-plane domain state through the mapping of its stray fields in the Fe. We also demonstrate that SEMPA can be used to image the domain wall chirality in these systems after milling away the capping layer and imaging the topmost magnetic layer directly.",
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Scanning electron microscopy with polarization analysis for multilayered chiral spin textures. / Lucassen, J.; Kloodt-Twesten, F.; Frömter, R.; Oepen, H.P.; Duine, R.A.; Swagten, H.J.M.; Koopmans, B.; Lavrijsen, R.

In: Applied Physics Letters, Vol. 111, Nr. 13, 132403, 25.09.2017.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

TY - JOUR

T1 - Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

AU - Lucassen, J.

AU - Kloodt-Twesten, F.

AU - Frömter, R.

AU - Oepen, H.P.

AU - Duine, R.A.

AU - Swagten, H.J.M.

AU - Koopmans, B.

AU - Lavrijsen, R.

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Y1 - 2017/9/25

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