Scalable non-linear and bias-dependent LF-noise model for improved InP HEMT based MMIC oscillator design

D. Schreurs, H. Meer, van, K. van der Zanden, W. Raedt, de, B. Nauwelaers

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

    2 Citaten (Scopus)
    1 Downloads (Pure)

    Samenvatting

    This paper focuses on two modelling aspects to improve low phase noise MMIC oscillator design. As the modelling of InP based HEMTs has mainly been limited to the representation of the small-signal and thermal noise behaviour, we present a scaleable non-linear and bias-dependent low-frequency (LF) noise model.
    Originele taal-2Engels
    Titel1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications : EDMO / MTT/ED/AP/LEO Societies Joint Chapter, United Kingdom and Republic of Ireland Section; with technical co-sponsorship from IEEE Electron Devices Society; in cooperation with IEEE Microwave Theory & Techniques Society ... [et al.];
    Plaats van productieNew York
    UitgeverijInstitute of Electrical and Electronics Engineers
    Pagina's187-192
    ISBN van geprinte versie0-7803-4135-X
    DOI's
    StatusGepubliceerd - 1997
    EvenementIEEE Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO '97, London, UK, 25 November 1997 - London, Verenigd Koninkrijk
    Duur: 25 nov 199725 nov 1997

    Congres

    CongresIEEE Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO '97, London, UK, 25 November 1997
    Verkorte titelEDMO '97
    LandVerenigd Koninkrijk
    StadLondon
    Periode25/11/9725/11/97
    AnderProc. IEEE Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO '97, London, UK, 24-25 November 1997

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