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Runtime monitoring based on interface specifications

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Samenvatting

Unclear descriptions of software interfaces between components often lead to integration issues during development and maintenance. To address this, we have developed a framework named ComMA (Component Modeling and Analysis) that supports model-based engineering of components. ComMA is a combination of Domain Specific Languages (DSLs) for the specification of interface signatures, state machines to express the allowed interaction behaviour, and constraints on data and timing. From ComMA models a number of artefacts can be generated automatically such as proxy code, visualizations, tests, and simulation models. In this paper, the focus is on the generation of runtime monitors to check interface conformance, including the state machine behaviour and the specified data and time constraints. We report about the development of this approach in close collaboration with the development of medical applications at Philips.

Originele taal-2Engels
TitelModelEd, TestEd, TrustEd - Essays Dedicated to Ed Brinksma on the Occasion of His 60th Birthday
RedacteurenJoost-Pieter Katoen, Joost-Pieter Katoen, Rom Langerak, Arend Rensink
UitgeverijSpringer
Pagina's335-356
Aantal pagina's22
ISBN van geprinte versie9783319682693
DOI's
StatusGepubliceerd - 2017
EvenementSymposium on ModelEd, TestEd, TrustEd in honor of Ed Brinksma on the occasion of his 60th birthday, 2017 - Enschede, Nederland
Duur: 18 okt. 201718 okt. 2017

Publicatie series

NaamLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume10500 LNCS
ISSN van geprinte versie0302-9743
ISSN van elektronische versie1611-3349

Congres

CongresSymposium on ModelEd, TestEd, TrustEd in honor of Ed Brinksma on the occasion of his 60th birthday, 2017
Land/RegioNederland
StadEnschede
Periode18/10/1718/10/17

Bibliografische nota

Publisher Copyright:
© Springer International Publishing AG 2017.

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