Resistance characterization for weak open defects

R.R. Montanes; J. Pineda de Gyvez; P.A.J. Volf

doi:10.1109/MDT.2002.1033788

Resistance characterization for weak open defects

R.R. Montanes
, J. Pineda de Gyvez
, P.A.J. Volf

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

132 Citaten (Scopus)

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Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests

Originele taal-2	Engels
Pagina's (van-tot)	18-26
Aantal pagina's	9
Tijdschrift	IEEE Design and Test of Computers
Volume	19
Nummer van het tijdschrift	5
DOI's	https://doi.org/10.1109/MDT.2002.1033788
Status	Gepubliceerd - 2002

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10.1109/MDT.2002.1033788

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abstract = "Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests",

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Resistance characterization for weak open defects

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