Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles

W. Chang, A. Proebstl, D. Goswami, M. Zamani, S. Chakraborty

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

6 Citaten (Scopus)
1 Downloads (Pure)

Samenvatting

Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.

Originele taal-2Engels
TitelProceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's37-42
Aantal pagina's6
ISBN van elektronische versie9781467377850
DOI's
StatusGepubliceerd - 18 sep 2015
Evenement3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015 - Hong Kong, China
Duur: 19 aug 201521 aug 2015

Congres

Congres3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
LandChina
StadHong Kong
Periode19/08/1521/08/15

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  • Citeer dit

    Chang, W., Proebstl, A., Goswami, D., Zamani, M., & Chakraborty, S. (2015). Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. In Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China (blz. 37-42). [7272682] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CPSNA.2015.16