Reliability assessment of potentiometers by 1/f noise analysis

E.P. Vandamme, L.K.J. Vandamme

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Originele taal-2Engels
TitelProc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis
Pagina's327-330
StatusGepubliceerd - 1994
Evenementconference; Proc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994 -
Duur: 1 jan. 1994 → …

Congres

Congresconference; Proc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994
Periode1/01/94 → …
AnderProc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994

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