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Reduction of the threshold current in quantum well lasers by optimization of the carrier capture efficiency

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

Samenvatting

We have investigated the carrier capture mechanism in quantum well lasers and its relevance for device characteristics. It is demonstrated that the dependence of the threshold current on the structure parameters of the layers in the active region is highly correlated with the electron capture efficiency. From our calculations it appears that not only the LO-phonon induced capture process but also the carrier-carrier scattering induced capture process oscillate as a function of quantum well width. The predicted structure parameters for an optimum capture efficiency are equivalent for these scattering processes, because in both capture mechanisms these oscillations arise from oscillations in the wave function overlap. The carrier-carrier scattering starts to dominate the capture process for carrier densities larger than 1 .1011 cm-2 in the quantum well. As a result an efficient capture process enhances the cooling of the carriers after injection, giving rise to a reduction of the carrier temperature and thus to a low threshold current. Furthermore, in multiple quantum well lasers a large capture efficiency contributes to uniform pumping of the quantum wells. The carrier capture is also relevant for the dynamical behaviour of a quantum well laser. We find that a large capture efficiency improves the modulation response of a quantum well laser due to a smaller amount of carrier accumulation in the barrier. By maximizing the carrier capture efficiency in laser structures we for the first time are able to predict the structure parameters of the layers in the active region for an optimum laser performance.

Originele taal-2Engels
TitelUltrafast Lasers Probe Phenomena in Semiconductors and Superconductors
UitgeverijSPIE
Pagina's130-139
Aantal pagina's10
DOI's
StatusGepubliceerd - 1 jan. 1992
EvenementUltrafast Lasers Probe Phenomena in Semiconductors and Superconductors 1992 - Somerset, Verenigde Staten van Amerika
Duur: 22 mrt. 1992 → …

Publicatie series

NaamProceedings of SPIE
UitgeverijSPIE
Volume1677
ISSN van geprinte versie0277-786X

Congres

CongresUltrafast Lasers Probe Phenomena in Semiconductors and Superconductors 1992
Land/RegioVerenigde Staten van Amerika
StadSomerset
Periode22/03/92 → …

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