Recombination reduction at the c-Si/RCA oxide interface through Ar-H2 plasma treatment

K. Landheer, P.C.P. Bronsveld, I. Poulios, F.D. Tichelaar, M. Kaiser, R.E.I. Schropp, J.K. Rath

Onderzoeksoutput: Bijdrage aan tijdschriftCommunicatieAcademicpeer review

1 Citaat (Scopus)

Samenvatting

An Ar‑H2 plasma treatment was applied on an ultrathin RCA oxide to create well-passivated silicon wafers with symmetric c‑Si/SiOx:H/a‑Si:H passivation layer stacks. The effective lifetime of these samples increased from 10 μs to 4 ms after annealing at 200 °C through Ar‑H2 plasma treatment of the oxide. The results indicate that the plasma treatment can modify the RCA oxide and this enables atomic hydrogen diffusion at low annealing temperature, leading to a well passivated c‑Si/SiOx:H interface. This might provide new possibilities to use wet chemical oxides in c-Si solar cells, for example as tunnel contacts.

Originele taal-2Engels
Pagina's (van-tot)1226-1230
Aantal pagina's5
TijdschriftApplied Surface Science
Volume396
DOI's
StatusGepubliceerd - 28 feb 2017

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