Samenvatting
Flat luminescent solar concentrator PV (LSC-PV) devices have in development for nearly 45 years. However, to enhance their integration potential in buildings and vehicles, this study is focused on bent LSC-PV devices. LSC PV modules with a 20 times20 mathrm{cm} 2 top surface area and 6 different curvatures (k, from 1 to 10 mathrm{m} {-1}) have been designed in Dassault Systèmes Solidworks and simulated by means of ray tracing in Synopsys LightTools. These modules are 20 mm thick, are made of PMMA with 110 parts per million (ppm) of Lumogen Red 305 dye, and silicon solar cells attached only to their rectangular edges with a total PV cell coverage area of 80 cm2 per module. The simulation results show better optical and electrical performances for the bent LSC-PV modules than for flat planar modules. The performance increases with the increase of curvature; for instance, an LSC-PV module with a curvature of mathrm{k}=10 mathrm{m} {-1} is 40% more efficient than a flat reference. Furthermore, in this study, the effect of reflection layers and sizing of the front surface of the bent LSC PV modules on their performance is investigated.
Originele taal-2 | Engels |
---|---|
Titel | 2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022 |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 89-91 |
Aantal pagina's | 3 |
ISBN van elektronische versie | 9781728161174 |
DOI's | |
Status | Gepubliceerd - 2022 |
Evenement | 49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, Verenigde Staten van Amerika Duur: 5 jun. 2022 → 10 jun. 2022 Congresnummer: 49 |
Congres
Congres | 49th IEEE Photovoltaics Specialists Conference, PVSC 2022 |
---|---|
Verkorte titel | PVSC 2022 |
Land/Regio | Verenigde Staten van Amerika |
Stad | Philadelphia |
Periode | 5/06/22 → 10/06/22 |
Bibliografische nota
Publisher Copyright:© 2022 IEEE.
Vingerafdruk
Duik in de onderzoeksthema's van 'Ray Tracing of Bent Applications of Luminescent Solar Concentrator PV Modules'. Samen vormen ze een unieke vingerafdruk.Uitrusting
-
Center for Multiscale Electron Microscopy (CMEM)
Friedrich, H. (Manager), Joosten, R. (Education/onderzoek medewerker), Schmit, P. (Education/onderzoek medewerker), Schreur - Piet, I. (Inhoud) & Spoelstra, A. (Education/onderzoek medewerker)
Physical ChemistryUitrusting/faciliteit: Onderzoekslaboratorium