Quantitative structural analysis of binary nanocrystal superlattices by electron tomography

Heiner Friedrich (Corresponding author), Cedric J. Gommes, Karin Overgaag, Johannes D. Meeldijk, Wiel H. Evers, Bart de Nijs, Mark P. Boneschanscher, Petra E. de Jongh, Arie J. Verkleij, Krijn P. de Jong, Alfons van Blaaderen, Daniel Vanmaekelbergh (Corresponding author)

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Samenvatting

Binary nanocrystal superlattices, that is, ordered structures of two sorts of nanocolloids, hold promise for a series of functional materials with novel collective properties. Here we show that based on electron tomography a comprehensive, quantitative, three-dimensional characterization of these systems down to the single nanocrystal level can be achieved, which is key in understanding the emerging materials properties. On four binary lattices composed of PbSe, CdSe, and Au nanocrystals, we illustrate that ambiguous interpretations based on two-dimensional transmission electron microscopy can be prevented, nanocrystal sizes and superlattice parameters accurately determined, individual crystallographic point and plane defects studied, and the order/disorder at the top and bottom surfaces imaged. Furthermore, our results suggest that superlattice nucleation and growth occurred at the suspension/air interface and that the unit cells of some lattices are anisotropically deformed upon drying.

Originele taal-2Engels
Pagina's (van-tot)2719-2724
Aantal pagina's6
TijdschriftNano Letters
Volume9
Nummer van het tijdschrift7
DOI's
StatusGepubliceerd - 8 jul. 2009
Extern gepubliceerdJa

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