Quantitative nanoscopy : tackling sampling limitations in (S)TEM imaging of polymers and composites

K. Gnanasekaran, R.C.Q. Snel, G. With, de, H. Friedrich

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6 Citaties (Scopus)

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Sampling limitations in electron microscopy questions whether the analysis of a bulk material is representative, especially while analyzing hierarchical morphologies that extend over multiple length scales. We tackled this problem by automatically acquiring a large series of partially overlapping (S)TEM images with sufficient resolution, subsequently stitched together to generate a large-area map using an in-house developed acquisition toolbox (TU/e Acquisition ToolBox) and stitching module (TU/e Stitcher). In addition, we show that quantitative image analysis of the large scale maps provides representative information that can be related to the synthesis and process conditions of hierarchical materials, which moves electron microscopy analysis towards becoming a bulk characterization tool. We demonstrate the power of such an analysis by examining two different multi-phase materials that are structured over multiple length scales.
TaalEngels
Pagina's130-139
Aantal pagina's10
TijdschriftUltramicroscopy
Volume160
DOI's
StatusGepubliceerd - 2016

Vingerafdruk

Polymers
sampling
Sampling
Transmission electron microscopy
Imaging techniques
Electron microscopy
transmission electron microscopy
composite materials
acquisition
electron microscopy
Composite materials
polymers
image analysis
Image analysis
modules
synthesis

Citeer dit

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Quantitative nanoscopy : tackling sampling limitations in (S)TEM imaging of polymers and composites. / Gnanasekaran, K.; Snel, R.C.Q.; With, de, G.; Friedrich, H.

In: Ultramicroscopy, Vol. 160, 2016, blz. 130-139.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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